TEM microscope advance 1.4 Angstrom resolution at less damaging (to sample) voltage

For the first time ever, directly interpretable (Transmission Electron Microscope) TEM images with atomic resolution better than 1.4 Angstrom were obtained at the very low operating voltage of 80kV.

The result was welcomed by some of the world’s leading research centers as an important milestone in nanocharacterization as now even light element materials such as carbon nanotubes and graphene can be imaged artifact-free and with high contrast while having highest lateral resolution.

Direct atomic resolution at 80kV was obtained for various classes of materials: gold nanoparticles, silicon and single wall carbon nanotubes. The smallest atomic distance resolved was the well-known silicon dumbbell distance of 1.36 Angstrom.

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